The University of Texas Center for Learning and
Memory's transmission electron microscope (TEM)
uses a custom Minus K negative-stiffness isolation
platform.
The measurements below show the
1.2 to 2.5-Hz horizontal vibrations the equipment
experienced in the fifth-floor lab before (left)
and after (right) isolation with a 0.4-Hz negative-stiffness
system.
(Measurements courtesy JEOL U.S.A.,
the TEM manufacturer)